| X射线光电子能谱的应用介绍 |
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| 引用本文： | 文美兰. X射线光电子能谱的应用介绍[J]. 化工时刊, 2006, 20(8): 54-56 |
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| 作者姓名： | 文美兰 |
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| 作者单位： | 东南大学物理系,江苏,南京,210096 |
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| 摘 要： | X射线光电子能谱(XPS)是较常用的表面分析技术之一,不仅能测定材料表面的组成元素,而且还能给出各元素的化学状态信息,在很多领域都有广泛用途。本文主要通过一些具体例子介绍X射线光电子能谱在表面元素的定性和定量分析方面的应用。
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| 关 键 词： | XPS 化学态 化学位移 |
| 收稿时间： | 2006-06-23 |
| 修稿时间： | 2006-06-23 |
Introduction of X-ray Photoelectron Spectroscopy Application |
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| Wen Meilan. Introduction of X-ray Photoelectron Spectroscopy Application[J]. Chemical Industry Times, 2006, 20(8): 54-56 |
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| Authors: | Wen Meilan |
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| Affiliation: | Department of Physics, Southeast University, Jiangsu Nanjing 210096 |
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| Abstract: | X-ray Photoelectron Spectroscopy(XPS) is one of tile common techniques on surface analysis,which can determine the elements of the materials and also can give the information of the elements' chemical states,and it can be applied in many fields.The specific examples were used to illustrate the applications of XPS in qualitative analysis and quantitative analysis. |
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| Keywords: | XPS chemical state chemical shift |
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