掺铂WO3-SiO2复合薄膜结构表征和气致变色性能研究

采用溶胶－凝胶法制备WO3－SiO2复合薄膜,对不同温度热处理的复合薄膜及单一组分薄膜的结构和气致变色性能进行了对比分析。XRD分析结果表明,复合薄膜的晶化温度提高、晶化程度降低,存在一定的晶格畸变;IR分析结果表明,在热处理过程中复合薄膜氧化钨分子间不易缩合,分子结构对称性低、变形多。性能测试结果表明,在复合薄膜中,WO3与SiO2之间的相界等结构缺陷为氢气提供扩散通道,使复合薄膜在热处理后气致变色性能优于单一组分薄膜。

Characterization of Pt-Doped Gasochromic WO3-SiO2 Thin Films

WO 3 SiO 2 thin films were prepared by the sol gel method.Differences of the structure and properties of WO 3,WO 3 SiO 2 thin films heated at different temperature are described.The X ray diffraction patterns indicate that the crystallization temperature of composite thin films increases and crystallinity decrease with some degree of crystal lattice distortion.The results of IR analysis indicate that tungsten oxide is not easy to polymerize in composite thin films.The measurements of optical properties of colored thin films indicate that phase boundaries in the composite thin films are the way for the diffusion of hydrogen and make them behave with excellent gasochromic properties.