首页 | 本学科首页   官方微博 | 高级检索  
     

原子力显微镜在高分子物理实验教学中的应用
引用本文:刘晶如,李银成,俞强.原子力显微镜在高分子物理实验教学中的应用[J].电子显微学报,2016(2):186-190.
作者姓名:刘晶如  李银成  俞强
作者单位:常州大学 材料科学与工程学院,江苏 常州,213164
基金项目:2010年江苏省级精品课程高分子物理(SCZ100641737),2014年常州大学校教育教学研究项目(GJY2014055)
摘    要:原子力显微镜主要用来表征样品的表面结构与形貌,操作容易、简便,分辨能力可达到纳米级别,是目前对材料分析与纳米科技研究的重要工具之一.以聚合物的支化结构、聚氨酯的微相分离结构、聚合物的结晶熔融行为和流延法单向拉伸制备高密度聚乙烯微孔膜4个实验为例,将原子力显微镜运用于高分子物理实验教学中,以更好地阐明聚合物结构与性能之间的关系,使学生可以更好地理解相关高分子物理的基本概念和理论,同时使他们分析和解决问题的能力得到提升.

关 键 词:原子力显微镜  高分子物理实验  教学  应用

Application of atomic force microscope in polymer experiments teaching
Abstract:Atomic force microscope is used to characterize the surface structure and morphology of the samples. It is easy to operate and the resolution can reach nanometer level. Atomic force microscope is one of the important tools for the analysis of materials and the research of nanotechnology. Four experiments were taken as examples, including the branched structure of polymer, the microphase separation structure of polyurethane, the crystallization and melting behavior of polymer and the preparation of high density polyethylene ( HDPE) microporous membranes by stretching HDPE casting films uniaxially. Atomic force microscope is applied to polymer physics experiments teaching in order to better clarify the intrinsic relationship between polymer structure and properties, and make the students deepen the understanding of the basic concept and theory of polymer physics and improve their ability to analyze and solve problems.
Keywords:atomic force microscope ( AFM)  polymer physics experiment  teaching  application
本文献已被 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号