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Addressing Memory and Speed Problems in Nondestructive Defect Characterization: Element-by-Element Processing on a GPU
Authors:S Sivasuthan  V U Karthik  A Rahunanthan  P Jayakumar  R S Thyagarajan  Lalita Udpa  S R H Hoole
Affiliation:1. Electrical and Computer Engineering Department, Michigan State University, East Lansing, MI, 48824, USA
2. Department of Mathematics and Computer Science, Edinboro University, Edinboro, PA, 16444, USA
3. US Army Tank Automotive Research Development and Engineering Center, Warren, MI, 48397-5000, USA
Abstract:
Keywords:
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