Lnear Phase FIR Filter on Measuring 3—D Surface |
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引用本文: | WANGYunshan YANGFujun 等.Lnear Phase FIR Filter on Measuring 3—D Surface[J].半导体光子学与技术,1997,3(2):109-114. |
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作者姓名: | WANGYunshan YANGFujun |
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作者单位: | ShangongUniversityofTechnology,Jinan250061,CHN |
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摘 要: | An optical technology for 3-D surface measurement is se up.The technology,based on a deformed projected grating pattern which carries the 3-D information of the measured object,can automatically and accurately obtain the phase map of a measured object by using a linear-phase FIR filter.In contrast to the 2-D fast Fourier transform technique,it‘s more than fast.Only one image pattern is sufficient for measuring .The phase map can be processed without assigning fringe orders and making distinction between a depression and an elevation.Theoretical analysis and experimental result are presented.
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关 键 词: | 三维物体表面 表面光度测量法 格子图像 线性滤波器 |
收稿时间: | 1996/11/15 |
Linear Phase FIR Filter on Measuring 3-D Surface |
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Abstract: | An optical technology for 3-D surface measurement is se up.The technology,based on a deformed projected grating pattern which carries the 3-D information of the measured object,can automatically and accurately obtain the phase map of a measured object by using a linear-phase FIR filter.In contrast to the 2-D fast Fourier transform technique,it‘s more than fast.Only one image pattern is sufficient for measuring .The phase map can be processed without assigning fringe orders and making distinction between a depression and an elevation.Theoretical analysis and experimental result are presented. |
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Keywords: | Linear-Phase FIR Filter Profilometry Projected Grating Image 3-D Surface |
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