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Lnear Phase FIR Filter on Measuring 3—D Surface
引用本文:WANGYunshan YANGFujun 等.Lnear Phase FIR Filter on Measuring 3—D Surface[J].半导体光子学与技术,1997,3(2):109-114.
作者姓名:WANGYunshan  YANGFujun
作者单位:ShangongUniversityofTechnology,Jinan250061,CHN
摘    要:An optical technology for 3-D surface measurement is se up.The technology,based on a deformed projected grating pattern which carries the 3-D information of the measured object,can automatically and accurately obtain the phase map of a measured object by using a linear-phase FIR filter.In contrast to the 2-D fast Fourier transform technique,it‘s more than fast.Only one image pattern is sufficient for measuring .The phase map can be processed without assigning fringe orders and making distinction between a depression and an elevation.Theoretical analysis and experimental result are presented.

关 键 词:三维物体表面  表面光度测量法  格子图像  线性滤波器
收稿时间:1996/11/15

Linear Phase FIR Filter on Measuring 3-D Surface
Abstract:An optical technology for 3-D surface measurement is se up.The technology,based on a deformed projected grating pattern which carries the 3-D information of the measured object,can automatically and accurately obtain the phase map of a measured object by using a linear-phase FIR filter.In contrast to the 2-D fast Fourier transform technique,it‘s more than fast.Only one image pattern is sufficient for measuring .The phase map can be processed without assigning fringe orders and making distinction between a depression and an elevation.Theoretical analysis and experimental result are presented.
Keywords:Linear-Phase FIR Filter  Profilometry  Projected Grating Image  3-D Surface
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