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Characterization of deep levels in semi-insulating gallium arsenide
Authors:Y N Mohapatra  N Balasubramanyam  Vikram Kumar
Affiliation:(1) Department of Physics and Materials Research Laboratory, Indian Institute of Science, 560 012 Bangalore, India
Abstract:Two traps with activation energies ofE c – 0·47 eV andE v + 0·79 eV have been detected in semi-insulating GaAs:Cr through optical transient current spectroscopy (otcs) in the temperature range 300–450 K. The latter trap gives rise to rising current transients which result in a negative peak in theotcs spectrum. The theoretical expressions for current transients have been derived.
Keywords:Gallium arsenide  deep levels  activation energy  current transients  optical transient current spectroscopy
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