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弹光和电光级联的组合相位调制型椭偏测量术
引用本文:李克武,王黎明,王志斌,张瑞,薛瑞,陈友华.弹光和电光级联的组合相位调制型椭偏测量术[J].光学精密工程,2016,24(4):690-697.
作者姓名:李克武  王黎明  王志斌  张瑞  薛瑞  陈友华
作者单位:1. 中北大学 信息与通信工程学院, 山西 太原 030051;2. 山西省光电信息与仪器工程技术研究中心, 山西 太原 030051;3. 中北大学 电子测试技术重点实验室, 山西 太原 030051
基金项目:国家国际科技合作专项(2013DFR10150),国家自然科学基金资助项目(No.61127015;山西省青年科技研究基金资助项目(2014021012)
摘    要:利用弹光调制器的偏振调制优势,提出了将弹光调制器和电光调制器级联的组合相位调制型椭偏测量术。该技术采用单光路实现信号探测,通过切换电光调制器的两个工作状态,并结合数字锁相信号处理技术来完成样品反射光的p分量和s分量的幅值比Ψ和相位差Δ的全范围高精度测量。对提出的新型椭偏测量原理进行了分析,搭建了相应的实验系统。完成了弹光调制器的调制电压峰峰值和相位调制幅值关系的定标,定标结果优于99.05%,然后还采用系统初始偏移值的方法对实验系统进行了校准。最后,运用该系统对石英玻璃反射样品进行了实验分析,得到的Ψ和Δ的测量精度分别优于0.08°和0.81°。实验结果显示系统校准有效地消除了电光调制器和弹光调制器的剩余双折射引入的测量误差;数据采集和处理时间均在ms量级。提出的测量技术具有宽光谱测量、工作稳定、重复度高、测量速率快、成本相对较低和系统便于工业自动化集成的潜在优势。

关 键 词:椭偏仪  相位调制型椭偏测量术  弹光调制  电光调制
收稿时间:2015-11-13

Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation
LI Ke-wu,WANG Li-ming,WANG Zhi-bin,ZHANG Rui,XUE Rui,CHEN You-hua.Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation[J].Optics and Precision Engineering,2016,24(4):690-697.
Authors:LI Ke-wu  WANG Li-ming  WANG Zhi-bin  ZHANG Rui  XUE Rui  CHEN You-hua
Affiliation:1. School of Information and Communication Engineering, North University of China, Taiyuan 030051, China;2. Engineering and Technology Research Center of Shanxi Province for Opto-electric Information and Instrument, Taiyuan 030051, China;3. Key Laboratory of Electronic Measurement Technology, North University of China, Taiyuan 030051, China
Abstract:On the basis of the advantages of photo-elastic modulation, a phase-modulated ellipsometry combined a photo-elastic modulator with an electro-optic modulator is proposed. It uses one single detection light path to obtain the signals.By switching two work conditions of the electro-optic modulator,it takes lock-in signal processing technology to solve out the two ellipsometric parameters, amplitude ratio Ψ and phase difference Δ, from the p component and s component of reflection light of a simple. The principle of the new type of ellipsometry is analyzed, and a principle prototype is set up. The relationship between the peak value of modulated voltage and the phase modulation amplitude of the photo-elastic modulator is calibrated, and the calibration result is better than 99.95%. Then, an instrument offset method is used to calibrate the experimental system. Finally, a quartz glass reflective sample is analyzed by using this system, and the measurement accuracy of the Ψ and Δ are respectively better than 0.08° and 0.81°. The experimental results show that the instrument offset method effectively eliminates the detection errors introduced by the residual birefringence of the photo-elastic modulator and electro-optic modulator, and the data acquisition time and signals processing time are in the order of the millisecond. In conclusion, this phase-modulated ellipsometry proposed has potential advantages of wide spectrum measurement, stable operation, high repetition rate, fast measurement speed, low cost, and is conducive to industrial automation integration.
Keywords:ellipsometer  phase-modulated ellipsometry  photo-elastic modulation  electro-optic modulation
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