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250-MHz advanced test systems |
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| Authors: | Gruodis A.J. Hoffman D.E. |
| Affiliation: | IBM Gen. Technol., Hopewell Junction, NY; |
| Abstract: | New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM |
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