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Irradiation Defects in Silicon Crystal
作者姓名:WUCheng-long  YANGDe-ren
作者单位:StateKeyLab.ofSiliconMaterials,ZhejiangUniversity,Hangzhou310027,CHN
摘    要:The application of irradiation in silicon crystal is introduced.The defects caused by irradiation are reviewed and some major ways of studying defects in irradiated silicon are summarized.Furthermore the problems in the investigation of irradiated silicon are discussed as well as its properties.

关 键 词:硅晶体  晶体缺陷  硅材料  辐射
收稿时间:2002/4/12

Irradiation Defects in Silicon Crystal
WU Cheng-long,YANG De-ren,Que Duan-lin.Irradiation Defects in Silicon Crystal[J].Semiconductor Photonics and Technology,2003,9(1):41-45.
Authors:WU Cheng-long  YANG De-ren  Que Duan-lin
Abstract:The application of irradiation in silicon crystal is introduced.The defects caused by irradiation are reviewed and some major ways of studying defects in irradiated silicon are summarized.Furthermore the problems in the investigation of irradiated silicon are discussed as well as its properties.
Keywords:Silicon crystal  Defect  Irradiation  CLC number:TN304Document code:A
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