| 基于BIST的编译码器IP核测试 |
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| 引用本文： | 谢志远,杨兴,胡正伟.基于BIST的编译码器IP核测试[J].国外电子元器件,2008(1):23-25. |
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| 作者姓名： | 谢志远 杨兴 胡正伟 |
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| 作者单位： | 华北电力大学,电子与通信工程系,河北,保定,071003 |
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| 摘 要： | 介绍了用于IP核测试的内建自测试方法（BIST）和面向测试的IP核设计方法，指出基于IP核的系统芯片（SOC）的测试、验证以及相关性测试具有较大难度，传统的测试和验证方法均难以满足。以编译码器IP核为例，说明了基于BIST的编译码器IP核测试的基本实现原理和具体实现过程，通过加入测试外壳实现了对IP核的访问、隔离和控制，提高了IP核的可测性。
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| 关 键 词： | 电路与系统 可测性设计 内建自测试 测试外壳 |
| 文章编号： | 1006-6977(2008)01-0023-03 |
| 修稿时间： | 2007年9月10日 |
Test of encoder and decoder IP core based on BIST |
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| XIE Zhi-yuan,YANG Xing,HU Zheng-wei.Test of encoder and decoder IP core based on BIST[J].International Electronic Elements,2008(1):23-25. |
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| Authors: | XIE Zhi-yuan YANG Xing HU Zheng-wei |
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| Affiliation: | XIE Zhi-yuan,YANG Xing,HU Zheng-wei(Dept.of Electronic & Communication Engineering,North China Electric Power University,Baoding 071003,China) |
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| Abstract: | The built-in self test(BIST)method for IP core and the design method for test-oriented IP core are introduced.Test,certification and related testing for SOC(system on chip) based on IP core are more difficult and the traditional testing methods are difficult to satisfy all requirements.The principium and the realization of IP core test based on BIST arre presented through the example of Encoder and Decoder IP core.Accessing,insulation and control of IP core were realized by adding a test wrapper,and then th... |
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| Keywords: | circuit and system design for test built-in self test test wrapper |
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