Conduction studies on Ta2O5 layer under different metallic electrodes

Rectification studies on Ta₂O₅ anodic oxide layers with vacuum-deposited Au, Ag, Pb, Bi, Sb contacts have been made. No correlation between critical voltage and work function for metal electrodes was found. Non-uniform and unpredictable behaviour of Ta₂O₅ films under different metals have indicated the dominant dependence of conduction on the flaw density in the oxide film.