| BaTiO_3半导瓷失效机理及可靠性增长技术 |
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| 引用本文： | 黎步银,姜胜林,龚树萍,周东祥. BaTiO_3半导瓷失效机理及可靠性增长技术[J]. 电子元件与材料, 2003, 22(10): 29-32 |
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| 作者姓名： | 黎步银 姜胜林 龚树萍 周东祥 |
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| 作者单位： | 华中科技大学电子科学与技术系,湖北,武汉,430074 |
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| 基金项目： | 湖北省自然科学基金，国家高技术研究发展计划(863计划)，2001ABB019，2001AA325040，， |
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| 摘 要： | 为了提高BaTiO3半导瓷的可靠性,系统地研究了可靠性增长技术。针对BaTiO3半导瓷不同的失效模式,重点研究了瓷体电场分布、电阻率及温场分布、热应力、电极界面应力对BaTiO3半导瓷可靠性的影响及其作用机理,并从原材料控制、材料配方设计、均匀化技术、电极技术及测试技术等方面提出了增加可靠性的方法。
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| 关 键 词： | 钛酸钡半导瓷 可靠性 失效模式 失效机理 |
| 文章编号： | 1001-2028(2003)10-0029-04 |
The Failure Mechanism of BaTiO3 Semiconducting Ceramics and the Technologies for Enhancing the Reliability |
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| LI Bu-yin,JIANG Sheng-lin,GONG Shu-ping,ZHOU Dong-xiang. The Failure Mechanism of BaTiO3 Semiconducting Ceramics and the Technologies for Enhancing the Reliability[J]. Electronic Components & Materials, 2003, 22(10): 29-32 |
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| Authors: | LI Bu-yin JIANG Sheng-lin GONG Shu-ping ZHOU Dong-xiang |
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| Abstract: | The technologies for enhancing the reliability of BaTiO3 semiconducting ceramics were studied. The mechanism of different failure modes of BaTiO3 semiconducting ceramics were analyzed. The emphasis was put on the distribution of electrical field, the distribution of resistivity and temperature, the inner thermal stress and the stress on electrode interfaces. Some methods to increase the reliability of BaTiO3 semiconducting ceramics are proposed, including the control of raw materials, the material formulas, the homogenization process, the electrode technology and the measurement techniques. |
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| Keywords: | BaTiO3 semiconducting ceramics reliability failure modes failure mechanism |
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