| 基于STK二次开发的链路测控仿真 |
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| 引用本文： | 丁学勇,崔津华.基于STK二次开发的链路测控仿真[J].电子科技,2015,28(6):21. |
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| 作者姓名： | 丁学勇 崔津华 |
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| 作者单位： | (西安电子科技大学 电子信息攻防对抗与仿真重点实验室,陕西 西安 710071) |
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| 摘 要： | 在航空航天任务过程中,测控覆盖率高就能提供实时、连续、可靠的信息支持。利用VC结合STK二次开发,建立了测控链路仿真模型。软件利用STK/X模块较好的显示效果与Access模块计算、显示测控链路的余量和测控链路覆盖范围。针对不同的地面站部署,可计算空间飞行器的测控覆盖率。实现VC与STK集成的二次开发可大幅节省了开发时间,该仿真方法对测控系统的设计具有参考价值。
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| 关 键 词： | 测控链路 STK二次开发 STK/X 仿真建模 |
Simulation of TT&C Based on Secondary Development of STK |
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| DING Xueyong,CUI Jinhua.Simulation of TT&C Based on Secondary Development of STK[J].Electronic Science and Technology,2015,28(6):21. |
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| Authors: | DING Xueyong CUI Jinhua |
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| Affiliation: | (Key Laboratory of Electronic Information Countermeasure and Simulation,Xidian University,Xi'an 710071,China) |
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| Abstract: | In the aerospace mandate,a high TT&C coverage can provide real-time,continuous,reliable information support.A simulation model of monitoring and control links is established based on VC with STK secondary development.The STK/X module is employed for better display and Access module for calculation and display of the link margin and coverage of the control links.For different ground station deployments,the TT&C of the spacecraft are computed.VC with STK integrated secondary development can greatly decrease the development time of control systems. |
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| Keywords: | TT C STK secondary development STK X simulation and modeling |
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