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On the inclusion of chain defects in the polyethylene lattice a statistical approach
Authors:J. Martinez Salazar  F. J. Baltá Calleja
Affiliation:(1) Instituto de Estructura de la Materia, Serrano, 119, 6 Madrid, Spain
Abstract:Summary A simple statistical calculation leads to a relation between crystallinity and concentration of defects (epsiv) times crystallite thickness yielding the average inclusion of chain defects per crystalline chain segment as an independent parameter. Comparison of X ray crystallinity data for branched isothermically crystallized polyethylene (PE) with buthyl or longer side sequences with our statistical predictions confirms inclusion of up to one defect per 100 carbon atoms (depending on epsiv) within the crystal lattice. These results are in good agreement with values derived from unit cell expansion measurements.
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