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多故障的测试序列问题研究
引用本文:王红霞,潘红兵,叶晓慧. 多故障的测试序列问题研究[J]. 兵工学报, 2011, 32(12): 1518-1523
作者姓名:王红霞  潘红兵  叶晓慧
作者单位:(海军工程大学 电子工程学院, 湖北 武汉 430033)
摘    要:针对武器装备发生多故障的实际情况,提出了一种新的多故障的测试序列优化方法.用实例阐明了单故障诊断策略隔离多故障可能会出现错误的结论;通过掩盖故障、碰集与最小集合覆盖的定义建立了故障源间的映射关系,使得可用求解集合覆盖的方法获得所有元件的掩盖故障;通过对单故障诊断策略扩展的方法获得多故障的测试算法,该算法扩展的对象是存在...

关 键 词:人工智能  多故障诊断  测试序列问题  隐藏故障  掩盖故障  碰集

Research on Test Sequence Problem for Multiple Fault Diagnosis
WANG Hong-xia , PAN Hong-bing , YE Xiao-hui. Research on Test Sequence Problem for Multiple Fault Diagnosis[J]. Acta Armamentarii, 2011, 32(12): 1518-1523
Authors:WANG Hong-xia    PAN Hong-bing    YE Xiao-hui
Affiliation:(Department of Electronic Engineering,Naval University of Engineering, Wuhan 430033,Hubei,China)
Abstract:Aiming at the situation that the weapon equipments take place multiple faults,a test sequence optimal method for the multiple faults is proposed.Firstly,it is explained that some wrong conclusions may be drawn from an example to use the single fault diagnosis strategy to the multiple faults.Secondly,the mapping relationship is established by using the definition of false failure,hitting set and minimal set cover,so that the false failure of all component can be obtained by using the method for solving the set cover.And then,the test algorithm for the multiple faults can be formed by extending the single fault diagnosis strategy,and the extend target is the leaf node containing the hidden failure and false failure.Finally,the validity of the algorithm is illustrated by an example and comparison with other algorithms.
Keywords:artificial intelligence  multiple faults diagnosis  test sequence problem  hidden failure  false failure  hitting set
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