Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits |
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| Authors: | Yu Wang Patrick Juliano Sopan Joshi Elyse Rosenbaum |
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| Affiliation: | Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA |
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| Abstract: | An electrothermal diode model intended for implementation in a SPICE-like simulator is presented. The model is valid in the high current, forward-bias and reverse-breakdown regimes where diodes operate during ESD events. We also present a procedure for extracting the temperature of an SOI diode from an I–V measurement. |
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