1Hospital of the University of Pennsylvania, Department of Radiology, Nuclear Medicine Section, 3400 Spruce Street, Philadelphia, PA 19104, USA
Abstract:
A method for determining the depth of interaction in both NaI(Tl) and BGO crystals is investigated. This technique takes advantage of the relationship between temperature and decay time in a scintillation crystal. The depth of interaction is ascertained by measuring the decay time in a crystal with a uniform temperature gradient applied along its depth. The application of determining the depth of interaction in positron emission tomography scanners is discussed.