A graphic approach to the analysis of a large X‐ray microanalysis dataset obtained via SEM–EDS |
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| Authors: | N. Yu. Parkhimovich A.R. Salikhov M.F. Imayev |
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| Affiliation: | 1. Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, Russia;2. Ufa State Aviation Technical University, Ufa, Russia;3. Bashkir State University, Ufa, Russia |
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| Abstract: | A graphical method for phase analysis of advanced materials by EDS–SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X‐ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations. |
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| Keywords: | advanced materials (Bi Pb)2Sr2Ca2Cu3O10+d graphic method particle identification phase composition X‐ray microanalysis |
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