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深亚微米VLSI设计中的Crosstalk问题分析及消除
引用本文:陈守顺,黄令仪,蒋见花,胡伟武.深亚微米VLSI设计中的Crosstalk问题分析及消除[J].电子与封装,2004,4(3):48-50,41.
作者姓名:陈守顺  黄令仪  蒋见花  胡伟武
作者单位:中科院微电子中心,北京市北土城西路3号,100029;中科院计算所,北京市科学院南路6号,100080
摘    要:随着特征尺寸降低到0.18μm以下,crosstalk日渐成为影响芯片设计成功与否的关键问题。本文分析了的深亚微米VLSI设计中由耦合电容造成的信号间的crosstalk问题,给出了一种峰值噪声电压的估计模型,并结合“龙芯一号”的设计,讨论了利用EDA工具解决crosstalk问题的流程。

关 键 词:VLSI  crosstalk  耦合电容

Analysis and Immune for Crosstalk Problem in Sub-micron VLSI Design
Chen Shoushun,Huang Lingyi,Jiang Jianhua,Hu Weiwu.Analysis and Immune for Crosstalk Problem in Sub-micron VLSI Design[J].Electronics & Packaging,2004,4(3):48-50,41.
Authors:Chen Shoushun  Huang Lingyi  Jiang Jianhua  Hu Weiwu
Affiliation:Chen Shoushun~1,Huang Lingyi~1,Jiang Jianhua~1,Hu Weiwu~2
Abstract:As technology scales into the deep submicron regime, crosstalk immune has been a critical issue to the designs.The author analyzes the crosstalk problem due to the coupling capacitance and presents an estimation model on the peak noise voltage as a practice, this paper introduces the crosstalk immunization in the design flow of "Godson-1" CPU.
Keywords:VLSI Crosstalk Coupling Capacitance
本文献已被 CNKI 维普 万方数据 等数据库收录!
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