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NUMERICAL SIMULATION FOR MEASURING YIELD STRENGTH OF THIN METAL FILM BY NANOINDENTATION METHOD
作者姓名:Ma Dejun  Xu Kewei  He Jiawen State Key Laboratory for Mechanical Behavior of Materials  Xian Jiaotong University  Xian
作者单位:Ma Dejun,Xu Kewei,He Jiawen State Key Laboratory for Mechanical Behavior of Materials,Xian Jiaotong University,Xian 710049
摘    要:NUMERICALSIMULATIONFORMEASURINGYIELDSTRENGTHOFTHINMETALFILMBYNANOINDENTATIONMETHOD①MaDejun,XuKewei,HeJiawenStateKeyLaboratory...


NUMERICAL SIMULATION FOR MEASURING YIELD STRENGTH OF THIN METAL FILM BY NANOINDENTATION METHOD
Abstract:The indentation process of aluminum film/silicon substrate combination by a rigid spherical indenter has been simulated using finite element method (FEM). It is demonstrated that both the yield strength and hardening index of the film affect the load displacement curve. An empirical relationship among the strength parameters and hardness of the film has been established from the FEM results. Utilizing the relationship and the hardness measured by nanoindentation test for two different indentation depths, the yield strength and plastic hardening index of the film can be estimated.
Keywords:nanoindentation method  thin metal film  mechanical properties  finite element method
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