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高平整度和低损伤碳化硅晶片的纳米磨削技术(英文)
引用本文:霍凤伟,郭东明,康仁科,冯光.高平整度和低损伤碳化硅晶片的纳米磨削技术(英文)[J].中国有色金属学会会刊,2012,22(12):3027-3033.
作者姓名:霍凤伟  郭东明  康仁科  冯光
作者单位:大连理工大学精密与特种加工教育部重点实验室
基金项目:Project (50975040) supported by the National Natural Science Foundation of China
摘    要:采用细粒度砂轮的纳米磨削来实现碳化硅晶片高平整度和低损伤加工新方法。磨削试验表明采用纳米磨削50.8mm碳化硅晶片时其平整度在1.0μm以内,表面粗糙度可达0.42nm。纳米磨削比双面研磨和机械抛光更能高效地对碳化硅晶片做更高平整度、更低损伤加工,可以取代双面研磨和机械抛光,并减小化学机械抛光去除量。研究结果对高效低成本制备高质量碳化硅晶片有参考价值。

关 键 词:碳化硅晶片  纳米磨削  杯形砂轮  平整度  表面粗糙度  损伤
收稿时间:20 August 2012

Nanogrinding of SiC wafers with high flatness and low subsurface damage
HUO Feng-wei, GUO Dong-ming, KANG Ren-ke, FENG Guang.Nanogrinding of SiC wafers with high flatness and low subsurface damage[J].Transactions of Nonferrous Metals Society of China,2012,22(12):3027-3033.
Authors:HUO Feng-wei  GUO Dong-ming  KANG Ren-ke  FENG Guang
Affiliation:Key Laboratory for Precision and Non traditional Machining of Ministry of Education, Dalian University of Technology, Dalian 116024, China
Abstract:Nanogrinding of SiC wafers with high flatness and low subsurface damage was proposed and nanogrinding experiments were carried out on an ultra precision grinding machine with fine diamond wheels. Experimental results show that nanogrinding can produce flatness less than 1.0μm and a surface roughness Ra of 0.42nm. It is found that nanogrinding is capable of producing much flatter SiC wafers with a lower damage than double side lapping and mechanical polishing in much less time and it can replace double side lapping and mechanical polishing and reduce the removal amount of chemical mechanical polishing.
Keywords:SiC wafer  nanogrinding  cup wheel  flatness  surface roughness  damage
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