| 基于SSPA器件的尺寸检测系统 |
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| 引用本文： | 邓冬梅,张成瑞,袁祥辉. 基于SSPA器件的尺寸检测系统[J]. 仪表技术与传感器, 2011, 0(12) |
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| 作者姓名： | 邓冬梅 张成瑞 袁祥辉 |
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| 作者单位： | 1. 重庆大学,光电工程学院光电技术与传感器实验室,重庆400044;重庆大学,光电技术及系统教育部重点实验室,重庆400044
2. 重庆大学,光电技术及系统教育部重点实验室,重庆400044 |
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| 基金项目： | 重庆大学“211工程”研究生开放实验室立项建设项目(S-0911112) |
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| 摘 要： | 研究了一种线阵MOS图像传感器即SSPA器件的原理和特性.分析和讨论了将其应用于物体尺寸检测的可行性,即根据SSPA器件的成像原理,其表面受光线照射的情况的差异,会引起内部各像元输出的视频信号幅值大小的不同,将其信号序列放大后做简单的二值化,利用脉冲计数的方法测量实现遮光物体的宽度、尺寸.基于以上分析和考虑,设计了一种基于8051单片机的快速尺寸检测系统:首先将前端信号采集、放大、二值化处理后作为异步计数器的脉冲输入,再由单片机在中断处理中读取异步计数器的计数值,并将数据处理、判断、显示与上传.最后提出了系统和SSPA器件在生产检测中的几种应用举例.
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| 关 键 词： | SSPA 二值化 单片机 尺寸检测 |
Study of Width Measuring System Based on SSPA Device |
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| DENG Dong-mei , ZHANG Cheng-rui , YUAN Xiang-hui. Study of Width Measuring System Based on SSPA Device[J]. Instrument Technique and Sensor, 2011, 0(12) |
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| Authors: | DENG Dong-mei ZHANG Cheng-rui YUAN Xiang-hui |
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| Affiliation: | DENG Dong-mei1,2,ZHANG Cheng-rui2,YUAN Xiang-hui2(1.Opto-Electronic Technology and Sensor Lab.of Opto-Electronic Engineering College,Chongqing University,Chongqing 400044,China,2.Key Lab.of Opto-Electronic Technology & System of the Education Ministry,China) |
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| Abstract: | The structure and principle of SSPA device,a kind of linear array of MOS imaging sensor were studied.Then the feasibility of width measureng using SSPA device was discussed.According to its property,the signal amplitude of each imaging pixel inside SSPA will reflect the illumination intensity of its surface.By counting the signal sequence after being binarized,the size or width of shading object can be obtained.Based on those,a kind of fast measuring system using 8051 MCU was designed.The signal of SSPA wil... |
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| Keywords: | SSPA binarization microcontroller width measurement |
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