β-SiC/Si heterojunction bipolar transistors with high currentgain |
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Authors: | Sugii T. Ito T. Furumura Y. Doki M. Mieno F. Maeda M. |
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Affiliation: | Fujitsu Labs. Ltd., Atsugi; |
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Abstract: | The combination of single-crystalline β-SiC and Si permits the fabrication of a heterojunction bipolar transistor (HBT) in which the conventional poly-Si or single-crystalline Si emitter is replaced with a single-crystalline SiC emitter, a technique compatible with existing Si technology. A common-emitter current gain of 800 is attained with this device. The value of the ideality factor n of the base current is 1.1, which suggests that diffusion current is dominant. The large number of misfit dislocations at the SiC/Si heterojunction are ineffective as recombination centers and do not deteriorate the characteristics of the HBT |
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