| 共模与差模传导干扰分析及抑制技术 |
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| 引用本文： | 孙伟国,邱扬,权修桥,田锦. 共模与差模传导干扰分析及抑制技术[J]. 电子质量, 2004, 0(10): 18-20 |
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| 作者姓名： | 孙伟国 邱扬 权修桥 田锦 |
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| 作者单位： | 西安电子科技大学机电工程学院,西安,710071;西安电子科技大学机电工程学院,西安,710071;西安电子科技大学机电工程学院,西安,710071;西安电子科技大学机电工程学院,西安,710071 |
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| 摘 要： | 电磁兼容(EMC)问题越来越受到人们的重视,而解决电磁兼容问题的实质则是如何抑制电磁干扰(EMI),电磁干扰主要分为共模干扰和差模干扰.本文首先介绍了电磁干扰的形式及起因,接着提出了测量和判别干扰模式的方法,最后对其分别提出了抑制技术并举了个在实际中进行抑制的例子.
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| 关 键 词： | 电磁兼容 电磁干扰 共模干扰 差模干扰 抑制技术 |
| 文章编号： | 1003-0107(2004)10-0018-03 |
Common-Mode And Differential-Mode Conducted Interference Analysis and Restraint Technology Research |
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| Sun wei-guo,Qiu yang,Quan xiu-qiao,Tian jinSchool of Mechanical and ElectronicEngineering,XIDIAN University,Xian. Common-Mode And Differential-Mode Conducted Interference Analysis and Restraint Technology Research[J]. Electronics Quality, 2004, 0(10): 18-20 |
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| Authors: | Sun wei-guo Qiu yang Quan xiu-qiao Tian jinSchool of Mechanical ElectronicEngineering XIDIAN University Xian |
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| Affiliation: | Sun wei-guo,Qiu yang,Quan xiu-qiao,Tian jinSchool of Mechanical and ElectronicEngineering,XIDIAN University,Xian 710071 |
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| Abstract: | Electromagnetic Compatibility(EMC) is being more and more regarded, whose essence is how to restrainElectromagnetic Interference(EMI). Which mainly includes Common-Mode interference and Differential-Mode interference .The article firstly introduces the form and cause of EMI, then discusses the method of measurement and judging the interferencepattern, finally proposes the technology of restraint respectively and makes an example in practice. |
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| Keywords: | EMC EMI Common-Mode interference Differential-Mode interference restraint technology |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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