| 虚拟仪器在存储元件记忆特性测试中的应用 |
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| 引用本文： | 俞承芳,虞惠华,汤庭鳌.虚拟仪器在存储元件记忆特性测试中的应用[J].半导体技术,2001,26(4):53-56. |
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| 作者姓名： | 俞承芳 虞惠华 汤庭鳌 |
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| 作者单位： | 复旦大学电子工程系, |
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| 基金项目： | 国家高技术研究发展计划(863计划);69876008; |
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| 摘 要： | 论述了虚拟仪器在存储元件测量中的应用；介绍了采用虚拟仪器测试存储元件记忆特性的方法，并指出虚拟仪器的功能在基本硬件确定之后，可通过软件编程来实现，因而具有很大的灵活性，在对程序稍作候改后能适用于不同存储器件的测试。
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| 关 键 词： | 存储元件 虚拟仪器 控制面板 记忆特性测试 程序设计 |
| 文章编号： | 1003-353X(2001)04-0053-04 |
| 修稿时间： | 2000年9月25日 |
The application of virtual instrument in memory characteristic testing of storage component |
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| YU Cheng-fang, YU Hui-hua, TANG Ting-ao.The application of virtual instrument in memory characteristic testing of storage component[J].Semiconductor Technology,2001,26(4):53-56. |
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| Authors: | YU Cheng-fang YU Hui-hua TANG Ting-ao |
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| Abstract: | The application of virtual instrument (VI) in memory component testing is described in this paper. The general transistor testing instrument can't be used to test its storage characteristic because the memorization performance of memory component requires it can be read out repeatedly after once writing into storage component. This paper focuses on the methodology of utilizing VI to test memorization characteristic of storage component. It is very flexible to realize the VI functions by software programming when the basic hardware is fixed. So, the VI tester can be used for different storage components so long as doing some software modification. |
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| Keywords: | storage component virtual instrument front panel block diagram |
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