| VLSI容错设计研究进展(2)——功能成品率与可靠性的研究 |
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| 引用本文： | 郝跃 赵天绪. VLSI容错设计研究进展(2)——功能成品率与可靠性的研究[J]. 固体电子学研究与进展, 1999, 19(2): 129-138 |
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| 作者姓名： | 郝跃 赵天绪 |
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| 作者单位： | 西安电子科技大学微电子研究所 |
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| 摘 要： | 带冗余的集成电路的成品率的估计对制造者来说是一个非常重要的问题。文中将集中分析和讨论带冗余的成品率模型和可靠性，给出了该领域研究进展的最新结果，并指出了进一步研究的方向和策略。
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| 关 键 词： | 成品率模型 容错技术 多级冗余 可靠性分析 |
Researching Development of IC FaulttolerantDesignA Study of the Functional Yield and the Reliability |
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| Hao YueZhao TianxuYi Ting. Researching Development of IC FaulttolerantDesignA Study of the Functional Yield and the Reliability[J]. Research & Progress of Solid State Electronics, 1999, 19(2): 129-138 |
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| Authors: | Hao YueZhao TianxuYi Ting |
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| Abstract: | It is an important problem to estimate the IC yield with redundance for manufacturers. Our emphasis is on analyzing and discussing the functional yield with redundance and reliability. In this paper, the researching development and the newest results of IC faulttolerant design are given, and the further researching direction and strategy are pointed out. |
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| Keywords: | Yield ModelFaulttolerant TechniqueMultiplelevel RedundanceReliability Analysis |
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