Choice of calibration equations in calibrating microwave test fixtures |
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Authors: | Jian Liu Weiwei Feng |
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Affiliation: | State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors , CAS, Beijing, PR China |
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Abstract: | The error theory of linear equation system has been applied to the calibration procedure of microwave network analyser in this article. A new explanation for the choice of the linear calibration equations is proposed and a general principle for choosing calibration equations is presented. The method can also be used to predict the occurrence of the problem of frequency limitation at some periodic frequencies. This principle is employed to the thru-short-delay (TSD) method and the solution using the chosen equations gives the most accurate results. A good agreement between the theory and the experiment has been obtained. |
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Keywords: | microwave network analyser microwave measurement calibration test fixture |
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