计算机片外Flash故障的研究

某产品计算机在低温测试过程中出现片外Flash故障,通过对芯片读写状态的分析,发现在低温状态下,芯片复位不充分产生的故障,深层次地分析Flash芯片的工作模式,利用冗余读操作,启动芯片内部状态机的运行,使芯片再次复位,解决此故障。

Research on an Off-chip Flash Fault

A product computer has an off-chip Flash fault during the cryogenic test process.Through the analysis of the chip reading and writing state,it is found that in the low temperature state,the failure caused by insufficient chip reset is deeply analysed,the working mode of the Flash chip is deeply analysed,and the operation of the internal state machine of the chip is started by using redundant reading operation,so that the chip is reset again to solve this failure.