Annealing effect on poly(vinylidene fluoride/trifluoroethylene) (70/30) copolymer thin films above the melting point

To further understand crystallization behaviors above the melting temperature (T_m), the morphologies and structure of ferroelectric poly(vinylidene fluoride/trifluoroethylene) [P(VDF–TrFE); 70/30] copolymer films at different temperatures were studied by atomic force microscopy, differential scanning calorimetry, and X‐ray diffraction (XRD). We found that there was a structural change in the P(VDF–TrFE) copolymer film above T_m, which corresponded to the transition from tightly arrayed grains to fiberlike crystals. For the samples annealed above T_m, heat treatment reduced the density of gauche defects and caused a better arrangement of the crystalline phase. So those samples were in the ferroelectric phase without gauche defects, with one sharp diffraction peak reflected in the XRD curves. It was helpful to further make clear the thermal behaviors from the melts of the P(VDF–TrFE) copolymers and discuss their application under higher temperatures. © 2009 Wiley Periodicals, Inc. J Appl Polym Sci, 2010