Weibull statistics in electrical aging of polyesterimide under AC voltage |
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| Authors: | Mohammed Nedjar Abderrahmane Beroual |
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| Affiliation: | 1. Laboratoire de Génie Electrique, Université Mouloud Mammeri, Tizi‐Ouzou, Algérie;2. Ecole Centrale de Lyon, Laboratoire AMPERE, CNRS UMR 5005, Ecully, France |
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| Abstract: | This article is aimed at the investigation of electrical aging of polyesterimide under AC voltage using Weibull statistical analysis. It's shown that the time to breakdown characteristic (V–t) of polyesterimide includes two zones (segments of straight line). The first zone characterizes a statistical dispersion of the intrinsic defects of material. The second zone expresses the real aging of polymer. The variation of the slope of lifetime curve is attributed to the change in the degradation mechanism. © 2010 Wiley Periodicals, Inc. J Appl Polym Sci, 2010 |
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| Keywords: | polyesterimide electrical aging failure Weibull statistics |
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