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La_(0.6)Sr_(0.4)CoO_3薄膜的制备及NTC特性研究
引用本文:娄非志,杨传仁,杨莉军,张继华,陈宏伟.La_(0.6)Sr_(0.4)CoO_3薄膜的制备及NTC特性研究[J].电子元件与材料,2010,29(6).
作者姓名:娄非志  杨传仁  杨莉军  张继华  陈宏伟
作者单位:电子科技大学电子薄膜与集成器件国家重点实验室,四川,成都,610054
基金项目:广东省教育部产学研结合重大专项资助项目 
摘    要:为研制具有较低室温电阻值的NTC薄膜热敏电阻,以La0.6Sr0.4CoO3陶瓷为靶材,采用RF磁控溅射法,在Al2O3基片上沉积了La0.6Sr0.4CoO3(LSCO)薄膜。研究了溅射过程中氩氧体积流量比对LSCO薄膜结晶性能和方阻的影响以及LSCO薄膜的阻温特性。结果表明:随着氩氧体积流量比的增加,LSCO薄膜的主晶相衍射峰强度及方阻均先增大后减小。LSCO薄膜具有显著的NTC特性,室温时的电阻温度系数α25为2.24×10–5;其lnR-T–1曲线具备良好的线形度,线性偏差仅为2.09%;另外,其室温时的电阻R25仅为18.75k?。

关 键 词:La0.6Sr0.4CoO3薄膜  RF磁控溅射法  结晶性能  NTC特性

Preparation and NTC behavior of La0.6sr0.4CoO3 thin films
LOU Feizhi,YANG Chuanren,YANG Lijun,ZHANG Jihua,CHEN Hongwei.Preparation and NTC behavior of La0.6sr0.4CoO3 thin films[J].Electronic Components & Materials,2010,29(6).
Authors:LOU Feizhi  YANG Chuanren  YANG Lijun  ZHANG Jihua  CHEN Hongwei
Abstract:In order to develop a kind of NTC thin film thermistor with low room temperature resistance R25, La0.6Sr0.4CoO3 (LSCO) thin films were deposited on the Al2O3 substrate by the RF magnetron sputtering method with LSCO ceramic as the target material. The effects of volume flux ratio of argon to oxygen during the sputtering process on the crystallization behavior and square resistance of the LSCO thin films were studied. The resistance-temperature behaviors of the LSCO thin films were also investigated. The results show that both the diffraction peak intensity of main crystal phase and the square resistance of the LSCO thin films increase first and then decrease with increasing volume flux ratio of argon to oxygen. The LSCO thin films show a significant NTC behavior with a room temperature -resistance coefficient α25 of 2.24×10–5, and their lnR-T–1 curve slightly deviates from the line LnR = 3.72+1.99×103/T (SD=2.09%). Moreover, the R25 of the obtained LSCO thin films is only 18.75 kΩ.
Keywords:La0  6Sr0  4CoO3 thin films  RF magnetron sputtering method  crystallization behavior  NTC behavior
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