XPS study of CZTSSe monograin powders |
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| Authors: | M Danilson M AltosaarM Kauk A KaterskiJ Krustok J Raudoja |
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| Affiliation: | Tallinn University of Technology, Ehitajate tee 5, 19086 Tallinn, Estonia |
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| Abstract: | The surface and bulk composition of Cu2ZnSn(SexS1-x)4 (CZTSSe) monograin powders were investigated by X-ray photoelectron spectroscopy (XPS). The concentration depth profiling of CZTSSe monograin powders was obtained by Ar+ ion etching.According to the XPS spectra of CZTSSe monograin powder, the binding energies of Zn 2p3/2, Cu 2p3/2, Sn 3d5/2, S 2p3/2 and Se 3d5/2 core levels after surface cleaning are located at 1021.6 eV, 932.4 eV, 486.1 eV, 161.5 eV, 53.9 eV, respectively. From XPS depth profile analysis, Cu deficiency and the excess of chalcogenides on the powder crystals surface were observed. |
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| Keywords: | Cu2ZnSn(SexS1-x)4 X-ray photoelectron spectroscopy Depth profiling |
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