首页 | 本学科首页   官方微博 | 高级检索  
     

原子量级条件下单晶硅磨削过程中的亚表面损伤
引用本文:郭晓光,郭东明,康仁科,金洙吉.原子量级条件下单晶硅磨削过程中的亚表面损伤[J].半导体学报,2007,28(9):1353-1358.
作者姓名:郭晓光  郭东明  康仁科  金洙吉
作者单位:大连理工大学精密与特种加工教育部重点实验室,大连 116023;大连理工大学精密与特种加工教育部重点实验室,大连 116023;大连理工大学精密与特种加工教育部重点实验室,大连 116023;大连理工大学精密与特种加工教育部重点实验室,大连 116023
摘    要:应用分子动力学仿真研究了原子量级条件下磨粒钝圆半径、磨削深度和磨削速度对单晶硅磨削后亚表面损伤层深度的影响.分子动力学仿真结果表明:在磨削深度和磨削速度相同情况下,随着磨粒钝圆半径的减小,损伤层深度和硅原子间势能亦减小.随着磨削深度的增大,损伤层深度和硅原子间势能增大.在磨削深度和磨粒钝圆半径相同的情况下,在20~200 m/s范围内,磨削速度对单晶硅亚表面损伤影响很小,说明分子动力学仿真对磨削速度的变化不敏感,因此可以适当提高仿真速度,从而缩短仿真时间和扩大仿真规模.单晶硅亚表面损伤主要是基于硅原子间势能的变化,并通过超精密磨削实验进行了实验验证.

关 键 词:分子动力学仿真  磨削  亚表面损伤  单晶硅  molecular  dynamics  grinding  subsurface  damage  monocrystal  silicon  原子量  条件  单晶硅  磨削过程  亚表面损伤  Scale  Atomic  Grinding  Silicon  Monocrystal  Damage  experiments  based  increasing  time  enlarge  means  MD  simulation  sensitive  changes
文章编号:0253-4177(2007)09-1353-06
修稿时间:4/29/2007 8:42:32 AM

Subsurface Damage in the Monocrystal Silicon Grinding on Atomic Scale
Guo Xiaoguang,Guo Dongming,Kang Renke and Jin Zhuji.Subsurface Damage in the Monocrystal Silicon Grinding on Atomic Scale[J].Chinese Journal of Semiconductors,2007,28(9):1353-1358.
Authors:Guo Xiaoguang  Guo Dongming  Kang Renke and Jin Zhuji
Affiliation:Key Laboratory of Precision and Non-Traditional Machining Technology of the Ministry of Education,Dalian University of Technology,Dalian 116023,China;Key Laboratory of Precision and Non-Traditional Machining Technology of the Ministry of Education,Dalian University of Technology,Dalian 116023,China;Key Laboratory of Precision and Non-Traditional Machining Technology of the Ministry of Education,Dalian University of Technology,Dalian 116023,China;Key Laboratory of Precision and Non-Traditional Machining Technology of the Ministry of Education,Dalian University of Technology,Dalian 116023,China
Abstract:A molecular dynamics (MD) simulation is carried out to analyze the effect of cutting edge radius,cut-depth,and grinding speed on the depth of subsurface damage layers in monocrystal silicon grinding processes on an atomic scale.The results show that when the cutting edge radius decreases in the nanometric grinding process with the same cut-depth and grinding speed,the depth of the damage layers and the potential energy between the silicon atoms decrease too.Also,when the cut depth increases,both the depth of the damage layers and the potential energy between silicon atoms increase.When the grinding speed is between 20 and 200m/s,the depth of the damage layers does not change much with the increase of the grinding speed under the same cutting edge radius and cut depth conditions.This means that the MD simulation is not sensitive to changes in the grinding speed,and thus increasing the grinding speed properly can shorten the simulation time and enlarge the simulation scale.In conclusion,the subsurface damage of monocrystal silicon is mainly based on the change of the potential energy between silicon atoms,which is verified by the ultra-precision grinding and CMP experiments.
Keywords:molecular dynamics  grinding  subsurface damage  monocrystal silicon
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《半导体学报》浏览原始摘要信息
点击此处可从《半导体学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号