LSI reliability prediction based on time |
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| Authors: | Pentti Jääskeläinen |
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| Affiliation: | Nokia Electronics, Components and Technology Dept., Helsinki, Finland |
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| Abstract: | The proposed reliability prediction model takes into account the development of integrated circuit technology as well as the general improvement of the reliability with time.The basic factor of the model is the circuit complexity. Besides the complexity the chip size and temperature factors are also included in the model. The model is applicable to both SSI-, MSI- and LSI-devices. |
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