FERROMAGNETIC RESONANCE STUDIES OF Co/CoFe_2O_4 MULTILAYERS

The Co/CoFe2O4 multilayers have been grown on the glass substrate using sputtering techniques. In these films the Co layers were measured to have the fcc structure with [11] axis perpendicular to the film plane, and the CoFe2O4 layers are amorphous. Ferromagnetic resonance measurements have been made as a function of the external magnetic field orientation in a plane perpendicular to the film. The effective magnetization, effective anisotropy constant and interface anisotropy constant have been determined. The influence of Co layers thickness on magnetic properties was discussed.