The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison |
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| Authors: | Walker C G H El-Gomati M M Assa'd A M D Zadrazil M |
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| Affiliation: | Department of Electronics, University of York, Heslington, York, United Kingdom. |
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| Abstract: | The secondary electron (SE) yield, delta, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of delta but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. |
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| Keywords: | Monte Carlo secondary electron yield low energy inelastic mean free path d band |
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