|
|||||
|
|
The IEEE standards on reliability program and reliability prediction methods for electronic equipment |
|
| Authors: | Michael Pechta Diganta Dasa Arun Ramakrishnanb |
| Affiliation: | 1. Institute of Advanced Sciences, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, Kanagawa 240-8501, Japan;2. Graduate School of Environment and Information Sciences, Yokohama National University, 79-7 Tokiwadai, Hodogaya-ku, Yokohama, Kanagawa 240-8501, Japan;3. Center for Creation of Symbiosis Society with Risk, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama, Kanagawa 240-8501, Japan |
| Abstract: | |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |