Optical properties of epitaxial BiFeO3 thin film grown on SrRuO3-buffered SrTiO3 substrate |
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| Authors: | Ji-Ping Xu Rong-Jun Zhang Zhi-Hui Chen Zi-Yi Wang Fan Zhang Xiang Yu An-Quan Jiang Yu-Xiang Zheng Song-You Wang Liang-Yao Chen |
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| Affiliation: | 1.Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China;2.State Key Laboratory of ASIC and System, School of Microeletronics, Fudan University, Shanghai 200433, China |
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| Abstract: | The BiFeO3 (BFO) thin film was deposited by pulsed-laser deposition on SrRuO3 (SRO)-buffered (111) SrTiO3 (STO) substrate. X-ray diffraction pattern reveals a well-grown epitaxial BFO thin film. Atomic force microscopy study indicates that the BFO film is rather dense with a smooth surface. The ellipsometric spectra of the STO substrate, the SRO buffer layer, and the BFO thin film were measured, respectively, in the photon energy range 1.55 to 5.40 eV. Following the dielectric functions of STO and SRO, the ones of BFO described by the Lorentz model are received by fitting the spectra data to a five-medium optical model consisting of a semi-infinite STO substrate/SRO layer/BFO film/surface roughness/air ambient structure. The thickness and the optical constants of the BFO film are obtained. Then a direct bandgap is calculated at 2.68 eV, which is believed to be influenced by near-bandgap transitions. Compared to BFO films on other substrates, the dependence of the bandgap for the BFO thin film on in-plane compressive strain from epitaxial structure is received. Moreover, the bandgap and the transition revealed by the Lorentz model also provide a ground for the assessment of the bandgap for BFO single crystals. |
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| Keywords: | BiFeO3 thin film Optical properties Spectroscopic ellipsometry Lorentz model Dielectric function |
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