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Dislocation mobility study of heavy ion induced track damage in LiF crystals
Authors:I Manika  J Maniks  K Schwartz
Affiliation:a ISSP, University of Latvia, 8 Kengaraga Str., LV 1063, Riga, Latvia
b CIMAP-GANIL, Caen, Bd H. Becquerel, BP 5133 14070 CAEN-cedex 05, France
c GSI Darmstadt, Planckstrasse 1, D-64219 Darmstadt, Germany
Abstract:The track damage created in LiF crystals by swift U, Xe and Kr ions with a specific energy of 11.1 MeV/u was studied using dislocation mobility measurements, track etching, SEM, AFM and optical microscopy. The results demonstrate high sensitivity of dislocation mobility to track core damage. The relationship between the energy loss of ions, dislocation mobility and track structure is discussed.
Keywords:61  80  Jh  65  72  Ff
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