A service level model for the control wafers safety inventory problem |
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Authors: | Shu-Hsing Chung He Yau Kang and WL Pearn |
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Affiliation: | (1) Biomaterials Laboratory, School of Materials Science and Engineering, Nanyang Technological University, Singapore, Block N 4.1-B1-01, 639798, Singapore;(2) Department of Pediatrics, Sphingolipid Signaling and Vascular Biology Laboratory, Johns Hopkins University, Suite 312, 550 North Broadway, Baltimore, MD 21205, USA; |
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Abstract: | This paper considers the control wafers safety inventory problem (CWSIP) in the wafer fabrication photolithography area. The objective is to minimize the total cost of control wafers, where the cost includes new wafers cost, re-entrant cost and holding cost while maintaining the same level of production throughput. For the problem under pulling control production environment, a nonlinear programming model is presented to set safety inventory levels so as to minimize total cost of control wafers. A numerical example is given to illustrate the practicality of the model. The results demonstrate that the proposed model is an effective tool for determining the service level of safety inventory of control wafers for each grade. |
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