An Iterative Method for Computing the Surface Resistance of YBCO Thin Films in the Nonlinear Regime of RF Power

A numerical method to find, in the nonlinear regime, the quality factor, the surface resistance, and the resonance frequency of YBCO microstrip line resonator, deposited on both sides of an MgO substrate, is presented. The numerical method is based on an iterative self-consistent technique used to find the RF magnetic field in the nonlinear regime of the dissipation mechanisms. The determination of the RF magnetic field yields to the corresponding surface resistance and resonance frequency. The dependence of the geometrical factor of the film on the RF magnetic field is discussed. This latter is usually used as constant in the literature. However, in our calculation this factor has a maximum at a certain RF input power.