首页 | 本学科首页   官方微博 | 高级检索  
     


Thermal shock resistance of flat plastic integrated circuit packages
Authors:Yoshitsugu Kojima  Takashi Ohta  Mitsumasa Matsushita  Minoru Takahara  Toshio Kurauchi
Abstract:Flat packages (FPs) were formed from epoxy molding compounds with various physical properties using a transfer molding machine. The compounds were prepared by changing kinds and amounts of additives and addition methods. The thermal shock test was carried out by the following procedures. The plastic package was soaked alternately in liquid nitrogen (?196°) and in liquid solder (200°) in the cycle of 140s. The median life to crack initiation was defined to be the cycles when half of the specimens exhibited crack initiation. According to linear fracture mechanics, the following expression was obtained relating the median life N, thermal stress σt, and strength σb; N = Curn:x-wiley:00323888:media:PEN760321007:tex2gif-stack-1·(σbt)m. We found the linear relation between logarithm of Nσurn:x-wiley:00323888:media:PEN760321007:tex2gif-stack-2 and logarithm of σbt for various packages, and estimated the values of C and m as 5 × 104 MPa2 and 5.5, respectively. The value of m was the same as that obtained for a dual-in-line package.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号