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热退火对射频反应溅射氮化铝薄膜场电子发射的影响
引用本文:邵乐喜,刘小平,谢二庆,贺德衍,陈光华.热退火对射频反应溅射氮化铝薄膜场电子发射的影响[J].无机材料学报,2001,16(5):1015-1018.
作者姓名:邵乐喜  刘小平  谢二庆  贺德衍  陈光华
作者单位:1. 湛江师范学院物理系, 广东湛江 524002; 2. 兰州大学物理科学与技术学院, 兰州 730000; 3. 北京工业大学材料科学与工程学院, 北京 100022
基金项目:国家自然科学基金(69806005);广东省教育厅自然科学研究基金(200048)
摘    要:以氮气为反应气体;用射频反应溅射方法制备了AIN薄膜,结合XPS和XRD表征考察了热退火后处理对样品场电子发射性能的影响.实验表明,热退火是改善样品场发射稳定性的有效途径,样品经700℃退火后,发射电流的涨落从未退火前的135μA下降到20μA;并且发射的开启电压、发射电流的涨落和滞后等对退火温度表现出强烈的依赖性.文中认为,退火处理造成了薄膜结构的变化,引起表面电子亲和势特性以及电导特性的改变,进而影响了其发射特性

关 键 词:AlN薄膜  场电子发射  热退火  滞后  
文章编号:1000-324(2001)05-1015-04
收稿时间:2000-8-7
修稿时间:2000年8月7日

Influence of Annealing on Electron Field Emission from AlN Films Prepared by RF Reactive Sputtering
SHAO Le-Xi,LIU Xiao-Ping,XIE Er-Qing,HE De-Yan,CHEN Guang-Hua.Influence of Annealing on Electron Field Emission from AlN Films Prepared by RF Reactive Sputtering[J].Journal of Inorganic Materials,2001,16(5):1015-1018.
Authors:SHAO Le-Xi  LIU Xiao-Ping  XIE Er-Qing  HE De-Yan  CHEN Guang-Hua
Affiliation:1.Department of Physics; Zhanjiang Normal College; Zhanjiang 524048; China; 2.School of Physics Science and Technology; Lanzhou University; Lanzhou 730000, China; 3.School of Material Science and Engineering, Beijing Polytechnic University, Beijing 100022, China
Abstract:Aluminium nitride(AIN) thin films were deposited by RF reactive sputtering and characterized with XPS and XRD. The influence of thermal annealing on the electron field emission characteristics of the AIN coating on Si substrate was investigated. The results show that the annealing treatment of the films is a prefer approach to improve the emission stability and has a remarkable effect on the turn-on voltage and hysteresis of the emission. It is suggested that the mechanism of these effects could be attributed to that the variation of emission properties of the films may arise from the change of surface electron affinity and conductivity due to the change of impurities and defects density in the films during annealing treatment at various temperatures.
Keywords:AIN film  electron field emission  annealing  hysteresis
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