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Strain mapping of a triple junction in nanocrystalline Pd
Authors:Harald Rö  sner,Christian Kü  bel,Yulia Ivanisenko,Lilia Kurmanaeva,Sergiy V. Divinski,Martin Peterlechner,Gerhard Wilde
Affiliation:aInstitut für Materialphysik, Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Straße 10, D-48149 Münster, Germany;bKarlsruhe Institute of Technology, Institute of Nanotechnology, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany;cKarlsruhe Nano Micro Facility, Karlsruhe Institute of Technology, D-76344 Eggenstein-Leopoldshafen, Germany
Abstract:Aberration-corrected transmission electron microscopy was used to provide structural information on a triple junction in nanocrystalline Pd. This triple junction consists of two intersecting Σ3 twin boundaries with a Σ9 grain boundary and is connected to a quadruple point via the Σ9 grain boundary. A comprehensive strain analysis of this triple junction using geometric phase analysis is presented and compared with a molecular dynamics simulation. The main results are: (i) the strain field of the core of the triple junction shows dislocation character and extends over a distance of about 0.5 nm; (ii) the intersecting boundaries result in a net translation of View the MathML source, which corresponds to a Burgers vector of an View the MathML source dislocation in the fcc lattice; (iii) a disclination emerging from the triple junction along the Σ9 grain boundary is balanced by a disclination of opposite sign emerging from the quadruple point. Based on the observation that the core of the triple junction can be described by the strain field of a dislocation, its energy was estimated using View the MathML source to be about 1.7 × 10−9 J m−1. The presence of a disclination dipole is thought to be essential for stabilization of the structure observed.
Keywords:Nanocrystalline materials   Severe plastic deformation   Grain growth   High resolution electron microscopy   Triple junction
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