龙芯1号处理器的故障注入方法与软错误敏感性分析

在纳米级制造工艺下以及在航天等特殊应用场合中，可靠性将是处理器设计中的一个重要考虑因素.以龙芯1号处理器为研究对象，探讨了处理器可靠性设计中的故障注入方法，并提出了一种同时运行两个处理器RTL模型的故障注入与分析方法，可以实现连续快速的处理器仿真故障注入.在此基础上，进一步分析了龙芯1号处理器的软错误敏感性，通过快速注入大约30万个软错误，保证了分析结果具有较好的统计意义，可以有效指导后续的容错与可靠性设计.

Fault Injection and Soft Error Sensitivity Characterization for Fault-Tolerant Godson-1 Processor

Dependability plays an important role in the design of nanometer-scale processors and applicationspecific processors exposed to harsh environments such as cosmic rays. Fault injection is employed to characterize the soft error sensitivity and validate the integrated fault tolerance mechanisms in a faulttolerant processor. With Godson-1 processor as the research prototype, a novel fault injection technique is presented, which can perform fast and continuous simulation-based fault injections to the subjected processor by running two synthesizable processor RTL models simultaneously. Based on this technique, about 30,0000 soft errors are injected into Godson-1 and the soft error sensitivity of Godson-1 is further investigated to direct the design of a fault-tolerant and dependable Godson-1 processor with good statistical significance.