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Curie point and a space charge relaxation in ferroelectric poly(vinylidene fluoride‐trifluoroethylene) copolymers with different thermal history
Authors:Valentin Kochervinskii  Inna Malyshkina  Sergey Bedin  Alexander Korlyukov  Mikhail Buzin  Rafael Shakirzyanov
Affiliation:1. Laboratory of polymer and composite materials, Karpov Institute of Physical Chemistry, Vorontsovo Pole 10, Moscow 105064, Russia;2. Faculty of Physics, M.V. Lomonosov Moscow State University, Leninskie Gory 1 Building 2, Moscow 119991, Russia;3. Educational scientific center of nanomaterials, Moscow State Pedagogical University, M. Pirogovskaya Street 1/1, Moscow 119991, Russia;4. A.N. Nesmeyanov Institute of Organoelement Compounds, Vavilova Street 28, Moscow 119991, Russia;5. National University of Science and Technology MISIS, Leninskiy Prospekt 4, Moscow 119049, Russia
Abstract:High‐temperature processes of space charge relaxation in films of poly(vinylidene fluoride‐trifluoroethylene) (70–30) have been investigated. The films were prepared by the crystallization from a solution in tetrahydrofuran at a room temperature. X‐ray data analysis showed that initial films crystallize in metastable state: a paraelectric phase is formed at fast crystallization below the Curie temperature. An exothermic process was observed at heating, indicating a solid‐state crystallization of metastable paraelectric regions. This process is controlled by melting of ordered regions formed at secondary crystallization. These transformations of structure affect characteristics of the high‐temperature space charge relaxation process. In particular, it was found that activation energy of extrinsic conductivity is reduced by several times in the region of ferroelectric‐paraelectric phase transition. An additional relaxation process was registered above the Curie temperature, which is caused by the relaxation of charges in double electric layer formed on an interface between an electrode (Au) and fluorine‐containing polymer. © 2018 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2018 , 135, 46186.
Keywords:crystallization  dielectric properties  spectroscopy  structure‐property relationships  thermal properties
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