| 1/3码的动态CMOS全自检电路的设计 |
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| 引用本文： | 李记军,李明,陆建松. 1/3码的动态CMOS全自检电路的设计[J]. 微计算机信息, 2006, 22(11): 212-213 |
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| 作者姓名： | 李记军 李明 陆建松 |
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| 作者单位： | 200072上海大学微电子研究与开发中心 |
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| 摘 要： | 自检测电路设计方法有多种多样,本文中介绍了TSC电路的概念,并采用1/3码的动态CMOS设计TSC电路,通过在Cadence环境下仿真,仿真结果表明本设计可行。
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| 关 键 词： | 故障安全 码字分离 1/3码检测器 全自检测电路(TSC) |
| 文章编号： | 1008-0570(2006)04-2-0212-02 |
| 修稿时间： | 2005-09-21 |
On the design of Dynamic totally self-checking 1-out-of-3 checker |
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| Li,Jijun,Li,Ming,Lu,Jiansong. On the design of Dynamic totally self-checking 1-out-of-3 checker[J]. Control & Automation, 2006, 22(11): 212-213 |
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| Authors: | Li Jijun Li Ming Lu Jiansong |
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| Abstract: | In the area of self-checking circuit design, it's known there are so many techniques. This paper introduces the concept of totally self-checking checker. This paper persents an 1-out-of-3 dynamic CMOS totally self-checking (TSC) checker . Through the emulator of Cadence, the result of experimentation indicates the design is feasible. |
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| Keywords: | fault-secure code-disjoint 1-out-of-3 code checker totally self-checking |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
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