基于椭偏法的烟尘粒子复折射率测量

粒子复折射率是计算粒子光散射特性的重要参数.传统的KBr样片透射测量粒子复折射率的方法过程复杂,对颗粒物粒径要求满足Mie散射条件.提出了基于椭偏法的烟尘粒子复折射率测量方法,推导了椭偏法测量复折射率的理论公式,将现场采集的烟尘粒子制备成以玻璃为基底的烟尘粒子薄膜,搭建了基于椭偏法的烟尘粒子复折射率测量实验装置,获得了烟尘粒子多光谱复折射率.实验结果表明,与KBr样片透射法的测量结果吻合较好,这为其颗粒物复折射率的测量提供了新的途径.

A complex index of refraction measurement of soot particles based on the ellipsometry method

A complex index of refraction of soot particles is an important parameter in the processing calculation of the scattering characteristics of particles.The traditional KBr sample wafer transmission method requires particle size to meet the Mie scattering condition,and the testing process is very complex.In this paper,a novel method for producing a complex index of refraction measurement of particles based on the ellipsometry method was proposed.First,the ellipsometry measurement for the complex index of refraction theory was deduced;then a particle film on a glass floor was prepared,and soot particles were collected on a practical boiler.An experiment setting was built,and the multi-spectrum complex index of refraction of the soot particles was measured.The experiment results show that the measurement data agrees well with the KBr sample wafer transmission method.The novel method provides a new testing method for measurement of the index of refraction of other grains.