(1) VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210 Kawasaki, Japan
Abstract:
A simplified probabilistic fault grading method is described. The concept of propagation probability is introduced in place of the sensitization probability of STAFAN, and the empirical parameters of STAFAN are eliminated. The division of input vectors into subsets is monitored by the activation or toggle rate. The accuracy of the method is examined for fault coverage estimation and for predicting the undetected faults.