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A general method for determining mixed-mode stress intensity factors from isochromatic fringe patterns
Authors:Robert J Sanford  James W Dally
Affiliation:

Ocean Technology Division, Naval Research Laboratory, Washington, DC 20375, U.S.A.

Mechanical Engineering Department, University of Maryland, College Park, MD 20742, U.S.A.

Abstract:A general method is presented for determining mixed-mode stress intensity factors KI and KII from isochromatic fringes near the crack tip. The method accounts for the effects of the far-field, non-singular stress, σox. A non-linear equation is developed which relates the stress field in terms of KI, KII, and σox to the co-ordinates, r and θ, defining the location of a point on an isochromatic fringe of order N.

Four different approaches for the solution of the non-linear equation are given. These include: a selected line approach in which data analysis is limited to the line θ = π and the K---N relation can be linearized and simplified, the classical approach in which two data points at (rm, θm) are selected where varpirm/varpiθ = 0; a deterministic method where three arbitrarily located data points are used; and an over-deterministic approach where m (>3) arbitrarily located points are selected from the fringe field.

Except for the selected line approach, the method of solution involves an iteractive numerical procedure based on the Newton-Raphson technique. For the over-deterministic approach, the method of least squares was employed to fit the K-N relation to the field data.

All four methods provide solutions to 0.1% providing that the input parameters r, θ, and N describing the isochromatic field are exact. Convergence of the iterative methods is rapid (3–5 iterations) and computer costs are nominal. When experimental errors in the measurements of r and θ are taken into consideration, the over-deterministic approach which utilizes the method of least squares has a significant advantage. The method is global in nature and the use of multiple-point data available from the full-field fringe patterns permits a significant improvement in accuracy of KI, KII, and σox determinations.

Keywords:
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